Quantitative analysis of deuterium in a-C:D layers, a Round Robin experiment


Quantitative analysis of deuterium in a-C:D layers, a Round Robin experiment

Behrisch, R.; Mayer, M.; Jacob, W.; Assmann, W.; Dollinger, G.; Bergmayer, A.; Kreissig, U.; Friedrich, M.; Sun, G.-Y.; Hildebrandt, D.; Akbi, M.; Schneider, W.; Schleußner, D.; Knapp, W.; Edelmann, C.

The absolute amount of deuterium in amorphous deuterated carbon (a-C:D) layers has been measured by six laboratories with different techniques, such as MeV ion beam analysis, secondary ion mass spectrometry (SIMS), and thermal desorption spectrometry (TSD). The a-C:D layers have been deposited from a CD4 glow discharge plasma onto carbon and silicon substrates. The results for the absolute numbers obtained with the different analysing techniques show a scatter of up to about 35% around the average value. The deviations are larger than the errors stated by the experimentalists and indicate possible systematic uncertainties in some of the experiments.

Keywords: Mass spectrometry; Deuterium

  • Journal of Nuclear Materials 281 (2000) 42-56

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Publ.-Id: 3957