Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy
Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy
Revesz, A. G.; Anwand, W.; Brauer, G.; Hughes, H. L.; Skorupa, W.
no abstrct delivered from author
Keywords: kein
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Lecture (Conference)
9th International Workshop on Slow Positron Beam Techniques for Solids and Surfaces (SLOPOS-9), Dresden, Germany, September 16-22, 2001
Permalink: https://www.hzdr.de/publications/Publ-4810
Publ.-Id: 4810