Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy


Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy

Revesz, A. G.; Anwand, W.; Brauer, G.; Hughes, H. L.; Skorupa, W.

no abstrct delivered from author

Keywords: kein

  • Lecture (Conference)
    9th International Workshop on Slow Positron Beam Techniques for Solids and Surfaces (SLOPOS-9), Dresden, Germany, September 16-22, 2001

Permalink: https://www.hzdr.de/publications/Publ-4810
Publ.-Id: 4810