Improving Resolution in k and r Space: A FEFF-based Wavelet for EXAFS Data Analysis


Improving Resolution in k and r Space: A FEFF-based Wavelet for EXAFS Data Analysis

Funke, H.; Chukalina, M.; Voegelin, A.; Scheinost, A.

Applying the wavelet analysis of Extended X-Ray Absorption Fine Structure (EXAFS) spectra to a Zn-Al layered double hydroxide, we could unequivocally identify the presence of Al and Zn atoms at the same distance of r ≈ 3 Å from the central Zn atom. The focused paths (including MS) at r ≈ 5 - 6 Å (2nd and 3th metal shell) show also both Al and Zn for all LDH spectra. With the newly developed FEFF-Morlet wavelet it is possible to resolve the two shells individually. The result is, that the 2nd shell not contains Al. This confirms directly the homogeneity of the Al - Zn distribution. No significant differences were found by shell fit- and wavelet analysis between the EXAFS spectra of pure Zn-,Co- or Ni LDH on the one hand and the mixed Zn/Co and Zn/Ni LDH on the other hand.

Keywords: EXAFS; wavelet analysis; layered double hydroxides

  • Lecture (Conference)
    13th International Conference on X-ray Absorption Fine Structure (XAFS13), 09.-14.07.2006, Stanford, United States
  • Contribution to proceedings
    13th International Conference on X-ray Absorption Fine Structure (XAFS13), 09.02.-14.07.2006, Stanford, United States
    AIP Conference Proceedings, Vol. 882, Melville, N.Y., 72-74

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Publ.-Id: 8613