Comment on Amorphization and Defect Recombination in Ion Implanted Silicon Carbide
Comment on Amorphization and Defect Recombination in Ion Implanted Silicon Carbide
Heera, V.
-
Journal of Applied Physics Vol 83, Number 7, pp 3935-3936
DOI: 10.1063/1.367314
Cited 1 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-928
Publ.-Id: 928