Hydrogen peroxide treatment induced rectifying behavior of Au/n-ZnO contact


Hydrogen peroxide treatment induced rectifying behavior of Au/n-ZnO contact

Gu, Q. L.; Ling, C. C.; Chen, X. D.; Cheng, C. K.; Ng, A. M. C.; Beling, C. D.; S. Fung, S.; DjurišIć, A. B.; Brauer, G.; Ong, H. C.

Conversion of the Au/n-ZnO contact from Ohmic to rectifying with H2O2 pretreatment was studied systematically using I-V measurements, x-ray photoemission spectroscopy, positron annihilation spectroscopy, and deep level transient spectroscopy. H2O2 treatment did not affect the carbon surface contamination or the EC–0.31 eV deep level, but it resulted in a significant decrease of the surface OH contamination and the formation of vacancy-type defects (Zn vacancy or vacancy cluster) close to the surface. The formation of a rectifying contact can be attributed to the reduced conductivity of the surface region due to the removal of OH and the formation of vacancy-type defects.

  • Applied Physics Letters 90(2007), 122101

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