In-situ X-ray diffraction during sputtering of Shape Memory Alloy (SMA) Ni-Ti thin films


In-situ X-ray diffraction during sputtering of Shape Memory Alloy (SMA) Ni-Ti thin films

Martins, R. M. S.; Braz Fernandes, F. M.; Silva, R. J. C.; Schell, N.

Kein Abstract vorhanden.

  • Lecture (Conference)
    DPG-Frühjahrstagung, 08.-12.03.2004, Regensburg, Germany

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Publ.-Id: 9800