Electrical resistance of ultrathin films determined by in situ spectroscopic ellipsometry
Electrical resistance of ultrathin films determined by in situ spectroscopic ellipsometry
Oates, T. W. H.
There is no abstract provided.
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Lecture (Conference)
5th International Young Scientists Conference, 28.-31.10.2004, Kyiv, Ukraine
Permalink: https://www.hzdr.de/publications/Publ-9828
Publ.-Id: 9828