Electrical resistance of ultrathin films determined by in situ spectroscopic ellipsometry


Electrical resistance of ultrathin films determined by in situ spectroscopic ellipsometry

Oates, T. W. H.

There is no abstract provided.

  • Lecture (Conference)
    5th International Young Scientists Conference, 28.-31.10.2004, Kyiv, Ukraine

Permalink: https://www.hzdr.de/publications/Publ-9828
Publ.-Id: 9828