In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films


In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films

Martins, R. M. S.; Silva, R. J. C.; Braz Fernandes, F. M.; Pereira, L.; Gordo, P. R.; Maneira, M. J. P.; Schell, N.

Kein Abstract vorhanden.

  • Lecture (Conference)
    2nd Int. Materials Symposium, 14.-16.04.2003, Campus da Caparica, Portugal

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Publ.-Id: 9840