4th International Workshop on High-Resolution Depth Profiling
Radebeul, Germany, June 17th - 21th , 2007

conference building : Steigenberger Parkhotel , Dresden-Radebeul

The purpose of the workshop is to provide an informal forum for exchange of ideas, discussion of problems and presentation of new results in the field of Low and Medium Energy Ion Scattering, RBS and ERDA with atomic layer depth resolution, Narrow Nuclear Resonance Profiling, as well as Surface Structure Determinations using ion beams. Contributions are also solicited from fields that have an impact on, and can be impacted by, the topics above. The Workshop will be concerned with both fundamental ion-solid interactions issues and important applications in areas such as nano- technology, semiconductor devices, surface and interface characterization on the atomic scale, thin-film growth and its characterization, etc. Both experimental and theoretical contributions are welcomed. This workshop follows three highly successful workshops in Abingdon,UK in 2000, in Kyungju, Korea in 2002, and in Bar Harbor , USA in 2005.

contact: Rainer Grötzschel (r.groetzschel@fzd.de)