Investigation of single-crystals of chromium implanted with 119Sn-ions of various energies

Single-crystals of chromium doped with 1016 119Sn ions per cm2 and energies ranging between 45 and 190 keV were investigated with conversion electron M¨ossbauer spectroscopy (CEMS), Auger electron spectroscopy (AES), grazing angle X-ray diffraction (GAXRD), and scanning electron microscopy (SEM). The M¨ossbauer spectra were found to be significantly different than those of the bulk. Both the maximum and the average hf. field values were higher by a factor of ∼3 than the corresponding quantities for the bulk. The overall shape of the spectra is also different. GAXRD study has revealed that the near-surface zone of the investigated samples has a nanocrystalline structure with the average size of grains ranging between ∼20 and ∼40 nm. The latter seems to be the main reason for the observed enhancement of the spin-density and its distortion.