Electrical characterization of deep levels in N+-implanted ZnO single crystal

Electrical characterization of deep levels in N+-implanted ZnO single crystal

Gu, Q. L.; Ling, C. C.; Brauer, G.; Anwand, W.; Skorupa, W.

• Poster
  4th International Conference on Materials for Advanced Technologies (ICMAT 2007), 01.-06.07.2007, Singapore, Singapore

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