Growth and optical characterization of dielectric/metal nanocomposites

Thin films of Ag nanoclusters embedded in dielectric aC and SiO2 media have been prepared by pulsed cathodic arc and dual magnetron sputtering. The optical properties of the composite layers have been investigated by spectroscopic ellipsometry. The results show the dependence of the plasmon resonance band of the Ag particles from temperature and Ag concentration.