Spectroscopic THz near-field microscope
Spectroscopic THz near-field microscope
von Ribbeck, H.-G.; Brehm, M.; van der Weide, D. W.; Winnerl, S.; Drachenko, O.; Helm, M.; Keilmann, F.
We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented.
Keywords: terahertz; SNOM
- Optics Express 16(2008), 3430-3438
Permalink: https://www.hzdr.de/publications/Publ-11194