Enhancement of the Intensity of the Short-Wavelength Visible Photoluminescence from Silicon-Implanted Silicon-Dioxide Films Caused by Hydrostatic Pressure During Annealing

Enhancement of the Intensity of the Short-Wavelength Visible Photoluminescence from Silicon-Implanted Silicon-Dioxide Films Caused by Hydrostatic Pressure During Annealing

Tyschenko, I. E.; Rebohle, L.; Yankov, R. A.; Skorupa, W.; Misiuk, A.

• Applied Physics Letters, Vol. 73, H. 10, 7. Sept. 1998 S. 1418 - 1420

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