Design of the Nijmegen High-Resolution FIR-FEL

Lehnert, U.; Jongma, R.; Dunkel, K.; Piel, C.; van der Meer, A.; Michel, P.; Wuensch, R.; van der Zande, W.; van der Geer, K.; van der Slot, P.

abstract available

Contribution to proceedings
30th International (FEL) Conference on Free Electron Laser, 24.-29.8.2008, Gyeongju, Republic of Korea

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