Characterization of single ZnO nanorods by conductive atomic force microscopy

Beinik, I.; Teichert, C.; Brauer, G.; Anwand, W.; Chen, X.; Hsu, Y. F.; Djurisic, A. B.

Poster
International Symposium Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (PFM-2009), 23.-27.06.2009, Aveíro, Portugal

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