Characterization of single ZnO nanorods by conductive atomic force microscopy

Characterization of single ZnO nanorods by conductive atomic force microscopy

Beinik, I.; Kratzer, M.; Wang, L.; Brauer, G.; Anwand, W.; Teichert, C.

• Poster
  Joint Annual Meeting of the Austrian Physical Society (ÖPG), 02.-04.09.2009, Innsbruck, Austria

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