Ion beam analysis with sub nanometer depth resolution

Kosmata, Marcel

Ion beam analysis with sub nanometer depth resolution

Kosmata, M.

no Abstract (keine Kurzbeschreibung erforderlich)

Keywords: Little John; QQDS; high resolution depth profiling; ERDA; RBS; magnetic spectrometer; ion beam analysis; concentration profile; thin layer

Lecture (others)
4th Graduate Students Seminar, 16.-18.09.2009, Krögis, Germany

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