Process diagnostics and non-destructive testing using high-resolution gamma-ray tomography
Process diagnostics and non-destructive testing using high-resolution gamma-ray tomography
Bieberle, A.; Hoppe, D.; Hampel, U.
In this paper, a high-resolution gamma-ray computed tomography (CT) measurement system is presented that was developed to determine phase fractions and other flow parameters in industrial devices operated under real industrial conditions. From CT scans non-superimposed cross-sectional images are reconstructed, which show the local gamma-ray attenuation coefficients within the scanned object slice. An advanced fast read-out electronics facilitates 2-D visualization of rapidly rotating multiphase distributions, such as in stirred chemical reactors or hydrodynamic machines. Furthermore, the CT measurement system can be applied to non-destructive testing of high-density devices to achieve information about the structure of material, i.e. when exposed to mechanical stress.
Keywords: Gamma-ray computed tomography
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Contribution to proceedings
IEEE International Conference on Imaging Systems and Techniques (IST 2010), 01.-02.07.2010, Thessaloniki, Griechenland
Process diagnostics and non-destructive testing using high-resolution gamma-ray tomography -
Lecture (Conference)
IEEE International Conference on Imaging Systems and Techniques (IST 2010), 01.-02.07.2010, Thessaloniki, Griechenland
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