Quantitative KPFM Measurements on Silicon Nanowire Structures
Quantitative KPFM Measurements on Silicon Nanowire Structures
Baumgart, C.
This workshop focus on the electrical characterization of vertical and horizontal Si nanowires.
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 14379) publication
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Lecture (others)
Workshop FZD/FZJ: Silicon Nanowire Structures, 29.04.2010, Dresden, Germany
Permalink: https://www.hzdr.de/publications/Publ-14379
