In-situ X-ray Scattering: a Tool to Investigate the Formation of Nanostructures
In-situ X-ray Scattering: a Tool to Investigate the Formation of Nanostructures
Grenzer, J.
Nowadays, the development of new materials is often associated with specific properties of functionalized nanostructures. X-ray investigations are a very important tool to find the link between the functional (magnetism, luminescence) and the corresponding structural properties (size, orientation etc.) that are generating this function and to explain the underlying physical processes. This knowledge makes it possible to design new materials with specific properties. We report on (in-situ) X-ray studies that are focused to ion-beam sputtering (IBS) processes creating nanostructures either by ion beam erosion or by sputter deposition processes.
Keywords: in-situ x-ray diffraction; nano structures
Involved research facilities
- Rossendorf Beamline at ESRF DOI: 10.1107/S1600577520014265
Related publications
- DOI: 10.1107/S1600577520014265 is cited by this (Id 14921) publication
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Invited lecture (Conferences)
SLS Seminar, 19.02.2010, Villigen, Schweiz
Permalink: https://www.hzdr.de/publications/Publ-14921