Influence of Rippled Substrate Morphology on the Interlayer Exchange Coupling in Fe/Cr/Fe Thin Films
Influence of Rippled Substrate Morphology on the Interlayer Exchange Coupling in Fe/Cr/Fe Thin Films
Körner, M.; Lenz, K.; Liedke, M. O.; Strache, T.; Mücklich, A.; Keller, A.; Facsko, S.; Fassbender, J.
We have investigated the interlayer exchange coupling in Fe (4nm)/Cr (x nm)/Fe (4nm) thin film trilayers (x=0–5 nm) deposited on rippled amorphous silicon substrates. The substrate surface was periodically modulated (periods of 22 nm and 37 nm) by Ar+ ion erosion. The influence of the resulting surface and interface structure on the magnetic properties has been investigated by magneto-optical Kerr effect (MOKE). We found an orange peel type coupling, predicted by N´eel’s theory and, due to the morphology of the magnetic layers, a strong uniaxial magnetic anisotropy in the system.
This work is supported by DFG grant FA 314/6-1.
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 18514) publication
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Poster
The Nanoscale Modification of Surfaces and Thin Films workshop, 30.08.-03.09.2009, Rathen, Deutschland
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