Semiconductor spectroscopy using THz free-electron lasers
Semiconductor spectroscopy using THz free-electron lasers
Helm, M.
Abstract
I will briefly review the history of THz free-electron lasers (FEL) as versatile sources for semiconductor spectroscopy and present some recent experiments using the FEL in Dresden.
Keywords: free-electron laser; terahertz; semiconductors
Involved research facilities
- Radiation Source ELBE DOI: 10.17815/jlsrf-2-58
Related publications
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 19180) publication
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Invited lecture (Conferences)
38th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW_THz 2013), 01.-06.09.2013, Mainz, Germany -
Contribution to proceedings
38th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW_THz 2013), 01.-06.09.2013, Mainz, Germany
Permalink: https://www.hzdr.de/publications/Publ-19180
