Study on a simulation-based scatter correction for high-resolution gamma-ray tomography

A simulation-based scatter correction algorithm is applied on CT data sets of mockup measurements acquired from the high-resolution gamma-ray tomography system of the Institute of Fluid Dynamics at Helmholtz-Zentrum Dresden-Rossendorf (HZDR). Based on the initially reconstructed image and on previous knowledge about the material distributions of the scanned object, a first-order scatter sinogram is simulated which allows a correction of the original data set. For two different mockups, the amount of the scatter and the shape of the imaging artifacts are analyzed.