Infrared images of single electrons
Infrared images of single electrons
Winnerl, S.; Helm, M.
Scattering-type near-field optical microscopy (s-SNOM) is a powerful technique to image nano objects. It can be employed in a broad spectral range, namely the complete infrared region spanning from the terahertz range up to the visible range. In this article we describe a system which utilizes a free-electron laser as a spectrally narrow and widely tunable source of infrared radiation. This system was employed to study electrons confined in self-assembled InAs quantum dots. We spatially resolved single quantum dots upon resonant excitation of transitions between discrete energy levels of the confined electrons.
Keywords: near-field microscopy; terahertz nano-spectroscopy; single quantum dots
Involved research facilities
- Radiation Source ELBE DOI: 10.17815/jlsrf-2-58
Related publications
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 19709) publication
- Imaging & Microscopy 15(2013)1, 40-42
Permalink: https://www.hzdr.de/publications/Publ-19709