Phase analysis with HRPD and XAFS in the USiO4-ZrSiO4 solid solution system
Phase analysis with HRPD and XAFS in the USiO4-ZrSiO4 solid solution system
Hennig, C.
Invesigation the solid solution USiO4-ZrSiO4 is related with the problem to avoid the formation of the related oxides UO2 and ZrO2. In previous studies we have shown that the formation of UO2 can be relatively easy supressed by using an excess of SiO2 during the hydrothermal synthesis already at relatively low temperature. The formation of ZrO2 is obviously more pronounced in the same temperature range. A part of Zr enters the amorphous phase. The aim of this study is to investigate the Zr containing phases in crystalline and in amorphous state with HRPD and XAFS, respectively.
Keywords: solid solution; USiO4; ZrSiO4; HRPD; XAFS
Involved research facilities
- Rossendorf Beamline at ESRF DOI: 10.1107/S1600577520014265
Related publications
- DOI: 10.1107/S1600577520014265 is cited by this (Id 20272) publication
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Invited lecture (Conferences)
TALISMAN Projekt meeting, 06.02.2014, Jülich, Germany
Permalink: https://www.hzdr.de/publications/Publ-20272