Structural studies of thin Pd films loaded with hydrogen
Structural studies of thin Pd films loaded with hydrogen
Melikhova, O.; Cizek, J.; Vlcek, M.; Lukac, F.; Prochazka, I.; Anwand, W.; Brauer, G.
In this work variable energy positron annihilation spectroscopy was employed for investigation of defects created in Pd films electrochemically charged with hydrogen. The development of hydrogen-induced defects in nanocrystalline, polycrystalline and epitaxial Pd films were compared. It was found that absorbed hydrogen causes plastic deformation and increases defect density in all Pd films studied. Moreover, buckling was observed in nanocrystalline and polycrystalline films loaded above certain critical hydrogen concentration.
Keywords: Pd films; hydrogen loading; defects; positron annihilation
Involved research facilities
- Radiation Source ELBE DOI: 10.17815/jlsrf-2-58
- P-ELBE
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- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 20509) publication
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DOI: 10.1088/1742-6596/505/1/012015
Permalink: https://www.hzdr.de/publications/Publ-20509