Post-implantation annealing of SiC studied by slow positron spectroscopies

Post-implantation annealing of SiC studied by slow positron spectroscopies

Brauer, G.; Anwand, W.; Coleman, P.; Störmer, J.; Plazaola, F.; Campillo, J. M.; Pacaud, Y.; Skorupa, W.

• J. Phys.: Condens. Matter 10 (1998) 1147

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