Applications of Atomic Force Microscopy in Particle Technology

Atomic force microscopy (AFM) and the colloidal probe mode allow for the first time the direct measurement of particle interactions. Thus, it is the direct way to evaluate the adhesion of particles to surfaces or to each other. With the direct measurement it is significantly easier to quantify the effect of changing surface properties on the interaction forces. Several surface properties influence the interaction forces like surface roughness, local chemical composition (e.g. adsorbed surfactants), electrostatic charge and surface energies.
Phase contrast AFM
The non-contact mode of AFM also allows characterizing the composition of a heterogeneous surface like that of a nano-composite material, with a high resolution, which is comparable to TEM. For this method, it is not necessary to prepare translucent samples, but only to minimize the surface roughness, e.g. by polishing to avoid a secondary signal.
Colloidal Probe AFM (dry)
The colloidal probe provides the real adhesion effects taking into account both the roughness of the substrate as well as that of the particle.
Colloidal Probe AFM (wet - liquid cell)
The colloidal probe measurements in the liquid phase allow quantifying the surface modification due to adsorption from the aqueous phase to the substrate, or to the particle at the cantilever itself. This adsorption of surfactants like modifiers or flotation collectors becomes visible as well as an interaction of the surface with one component of a water-alcohol mixture. The detection of nano-bubbles, which are one source of strong hydrophobic interactions, is also possible.