Determination of the Exchange Stiffness Constant in Ultrathin Magnetic Films by Ferromagnetic Resonance

In ultrathin magnetic films of 10 — 20 nm thickness, it is hardly possible to determine the exchange constant A using conventional techniques, such as Brillouin light scattering. In this work, a method is presented allowing for analytical determination of the exchange constant A in ultrathin magnetic films. Periodical surface modulations are introduced by electron beam lithography with subsequent sub-nanometer etching. The periodical stray field induces two-magnon scattering leading to a coupling of the uniform excitation with higher in-plane spin waves. An analytical model is presented, that can be used to precisely calculate the exchange constant A under usage of the measured ferromagnetic
resonance spectra (frequency versus field dependence). This work is supported by DFG grant LE2443/5-1.