Ferromagnetism induced by vacancy clusters in Silicon
Ferromagnetism induced by vacancy clusters in Silicon
Liu, Y.; Zhang, X. H.; Yuan, Q.; Han, J. C.; Zhou, S. Q.; Song, B.
Defect-induced ferromagnetism provides an alternative for organic and semiconductor spintronics. Though it is weak, it can be stable above room temperature. Till now it has been confirmed at least in oxides [1, 2] and carbon based materials [3, 4]. Interestingly, the relation between magnetism and defects in Silicon was demonstrated decades ago [5]. Since then, some progresses were made [6-9] and push forward the research of magnetic Mn doped Si a lot but it is drawn little attention itself. Here, with the latest growth purifying technique and sensitive measurements, we investigated the magnetism in Silicon after neutron irradiation and try to correlate the observed magnetism to particular defects in Si.
Keywords: defect-induced ferromagnetism; silicon; neutron irradiation; semiconductors
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Poster
ALS User Meeting, 05.-07.10.2015, Berkeley, United States of America
Permalink: https://www.hzdr.de/publications/Publ-22589