Non-destructive analysis of elements with low atomic numbers (Na – K) in artifacts using X-ray fluorescence analysis

Non-destructive analysis of elements with low atomic numbers (Na – K) in artifacts using X-ray fluorescence analysis

Schreiner, M.; Mantler, M.; Neelmeijer, C.; Mäder, M.

• Lecture (Conference)
  31th Int. Symp. on Archaeometry, Budapest, Hungary, April 27 - May 1, 1998

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