Calculation of Debye-Scherrer diffraction from polycrystalline samples under an arbitrary stress field

Calculating Debye-Scherrer diffraction patterns from polycrystalline materials under dynamic compression has been done in the Voigt (iso-strain) limit or in the Reuss (iso-stress) limit for small deviatoric stresses. These methods are appropriate for materials with low yield strength, where only small deviations from the hydrostat can be supported by the crystal structure or materials with low elastic anisotropy where the Voigt limit is valid. Here we present a method to calculate Debye-Scherrer diffraction patterns from polycrystalline samples under an arbitrary stress field. This method can calculate the strain tensor for each crystallite and can account for arbitrary sample texture and probe x-ray sources.