Layered artefacts: Non-destructive characterization by PIXE and RBS

Neelmeijer, Christian; Mäder, Michael; Wagner, Wolfgang; Schramm, H.-P.

Layered artefacts: Non-destructive characterization by PIXE and RBS

Neelmeijer, C.; Mäder, M.; Wagner, W.; Schramm, H.-P.

To identify paint layer arrangements and their elemental composition without sampling, the ion beam techniques PIXE/RBS are successfully applied on air.

Keywords: PIXE; RBS; proton beam on air; non-destructive analysis; paint layers

Optical Technologies in the Humanities, OWLS IV, ed. by D. Dirksen, G. von Bally, Springer, (1997) 105

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