Growth of buried oxide layers of SOI-structures by thermal oxidation of the top silicon layer
Growth of buried oxide layers of SOI-structures by thermal oxidation of the top silicon layer
Schroer, E.; Hopfe, S.; Tong, Q.-Y.; Gösele, U.; Skorupa, W.
- J. Electrochem. Soc. 144 (1997) 2205
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