Proton irradiation effects in silicon junction diodes and charge-coupled devices
Proton irradiation effects in silicon junction diodes and charge-coupled devices
Simoen, E.; Vanhellemont, J.; Alaerts, A.; Claeys, C.; Gaubas, E.; Kaniava, A.; Ohyama, H.; Sunaga, H.; Nashiyama, I.; Skorupa, W.
- Radiation Phys.Chem. 50 (1997) 417
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