X-ray scattering characterization of Si implanted with MeV Ge ions

X-ray scattering characterization of Si implanted with MeV Ge ions

Eichhorn, F.; Mazur, K.; Sass, J.

• Lecture (Conference)
  3th Autumn School on "X-ray scattering from surfaces and thin layers", Smolenice, Slovakia, Oct. 1 - 4, 1997

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