Synchrotron Mössbauer reflectometry: feasibility of depth selective phase analysis of thin films and multilayers

Synchrotron Mössbauer reflectometry: feasibility of depth selective phase analysis of thin films and multilayers

Nagy, D. L.; Bottyan, L.; Deak, L.; Gerdau, E.; Gittsovich, V. N.; Korecki, J.; Leupold, O.; Reuther, H.; Semenov, V. G.; Szilagyi, E.

• Lecture (Conference)
  XXXII Zakopane School of Physics, May 10 - 17, 1997

Permalink: https://www.hzdr.de/publications/Publ-2434