Proton irradiation effects in silicon devices

Simoen, E.; Vanhellemont, J.; Alaerts, A.; Claeys, C.; Gaubas, E.; Kaniava, A.; Ohyama, H.; Sunaga, H.; Nashiyama, I.; Skorupa, W.

Contribution to external collection
Proc. of the 7.Int.Symp. on "Recent progress in Accelerator Beam Applications", Takasaki, Japan, JAERI-Conf. 97-003, p. 224

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