Trends in valence band electronic structure of mixed uranium oxides
Trends in valence band electronic structure of mixed uranium oxides
Kvashnina, K. O.; Kowalski, P. M.; Butorin, S. M.; Leinders, G.; Pakarinen, J.; Bes, R.; Li, H.; Verwerft, M.
Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, b-UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and by computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical approximations.
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Chemical Communications 54(2018), 9757-9760
Online First (2018) DOI: 10.1039/C8CC05464A
Cited 25 times in Scopus
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