Picosecond-scale Terahertz pulse characterization with field-effect transistors
Picosecond-scale Terahertz pulse characterization with field-effect transistors
Regensburger, S.; Winnerl, S.; Klopf, J. M.; Lu, H.; Gossard, A. C.; Preu, S.
Precise real-time detection of Terahertz pulses is a key requirement in Terahertz communication technology,
non-destructive testing, and characterization of pulsed Terahertz sources. We experimentally evaluate the speed
limits of Terahertz rectification in field-effect transistors using the example of pulses from a free-electron laser. We develop an improved model for the description of these Terahertz pulses and demonstrate its validity experimentally by comparison to spectroscopic data as well as to expectation values calculated from free-electron laser physics.
The model in conjunction with the high speed of the detectors permits the detection of an exponential rise time of the pulses as short as 5 ps despite a post detection time constant of 11 and 14 ps for a large area and an antenna-coupled detector, respectively. This proves that field-effect transistors are excellent compact, roomtemperature Terahertz detectors for applications requiring an intermediate frequency bandwidth of several tens of GHz.
Keywords: THz detector; field-effect transistor; pulse diagnostics
Involved research facilities
- Radiation Source ELBE DOI: 10.17815/jlsrf-2-58
Related publications
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 27966) publication
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IEEE Transactions on Terahertz Science and Technology 9(2019)3, 262-271
DOI: 10.1109/TTHZ.2019.2903630
Cited 13 times in Scopus
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