Phase analysis in a-Fe after high-dose Si ion implantation by depth-selective conversion electron Mössbauer spectroscopy (DCEMS)

Walterfang, Marco; Kruijer, Stefan; Dobler, Max; Reuther, Helfried; Keune, Werner

Phase analysis in a-Fe after high-dose Si ion implantation by depth-selective conversion electron Mössbauer spectroscopy (DCEMS)

Walterfang, M.; Kruijer, S.; Dobler, M.; Reuther, H.; Keune, W.

Iron was implanted with 50 keV Si ions. The depth distribution of the formed Fe-Si phases was investigated by depth selective conversion electron Mossbauer spectroscopy.

Keywords: Ion implantation; iron silicides; Mossbauer spectroscopy

Lecture (Conference)
Int. Conf. Applications Mössbauer Effect, Garmisch-Partenkirchen, 29.8.-3.9.1999

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