Lateral ordering in semiconductor heterolayers studied by high resolution diffraction and specular reflectivity

Lateral ordering in semiconductor heterolayers studied by high resolution diffraction and specular reflectivity

Sass, J.; Mazur, K.; Eichhorn, F.

• Lecture (Conference)
  4th Autumn School on "X-ray scattering from surfaces and thin layers" Smolenice, Slovakia Sept. 22 - 25, 1999

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