Defect production and evolution during and after ion implantation studied by a combination of time-ordered BCA and MD simulations
Defect production and evolution during and after ion implantation studied by a combination of time-ordered BCA and MD simulations
Posselt, M.
Informations can be requested. Email: M.Posselt@fz-rossendorf.de
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Contribution to external collection
Proc. 1998 Int. Conf. on Ion Implantation Technology, Kyoto, Japan, June 22-26, 1998, eds.: J. Matsuo, G. Takaoka, Y. Yamada; IEEE, Piscataway, USA, 1998, IEEE Publications 98EX144, p. 678
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