Characterization of defect microstructure in MgRE (RE=Ce, Nd) alloys after processing by High-Pressure Torsion using Positron Annihilation Spectroscopy and a High Resolution X-ray Diffraction

Two MgRE (RE=Ce, Nd) alloys with ultrafine-grain (UFG) microstructures were prepared by high-pressure torsion (HPT) at room temperature. The in-depth distribution of defects was
characterized by Doppler broadening –variable energy positron annihilation spectroscopy (DBVEPAS). The characteristic S parameter increases in bulk after HPT processing relative to an
as-received sample and shows a relative stability between ½ and 10 turns, which suggests a rise in the open volume defect density. However, a theoretical analysis of the S(E) depth profile reveals an increase in the positron diffusion length from ~115 nm for the as-received state to ~207 nm after 10 HPT turns. Almost all the open volume defect consisted of dislocations
(positron lifetime of τ = 260 ps). The dislocation density deduced from high-resolution X-ray diffraction in the HPT disc radial direction was reasonably homogeneous (around 4 - 6e14 m-2).