Calculation of the unstressed lattice spacing of Al-doped c-BN thin films using data from synchrotron radiation diffraction experiments

Linss, V.; Pfeifer, T.; Halm, T.; Hoyer, W.; Richter, F.; Schell, N.

Keywords: Hard coatings; c-BN; Stress; Synchrotron radiation; X-ray diffraction

Poster
12th Intern. School on Vacuum, Electron and Ion Technologies (VEIT 2001), Varna, Bulgaria, Sept. 17-21, 2001

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