Use of slow positron implantation spectroscopy as a tool for investigation of hydrogen loaded Nb films
Use of slow positron implantation spectroscopy as a tool for investigation of hydrogen loaded Nb films
Cizek, J.; Kirchheim, R.; Pundt, A.; Brauer, G.; Anwand, W.
no abstract delivered from author
Keywords: kein
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Lecture (Conference)
9th TMR Workshop Switchable Metal-hydride Films, Mallorca, Spain, 16.-22.02.2002
Permalink: https://www.hzdr.de/publications/Publ-4783