Use of slow positron implantation spectroscopy as a tool for investigation of hydrogen loaded Nb films


Use of slow positron implantation spectroscopy as a tool for investigation of hydrogen loaded Nb films

Cizek, J.; Kirchheim, R.; Pundt, A.; Brauer, G.; Anwand, W.

no abstract delivered from author

Keywords: kein

  • Lecture (Conference)
    9th TMR Workshop Switchable Metal-hydride Films, Mallorca, Spain, 16.-22.02.2002

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