GaN thin films on SiC substrates studied using variable energy positron annihilation spectroscopy

Hu, Y. F.; Shan, Y. Y.; Beling, C. D.; Fung, S.; Xie, M. H.; Cheung, S. H.; Tu, J.; Brauer, G.; Anwand, W.; Tong, D. S. Y.

no abstract delivered from author

Keywords: kein

Contribution to external collection
Materials Science Forum 363-365 (2001) 478

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