Structural defects in ion implanted 4H-SiC epilayers


Structural defects in ion implanted 4H-SiC epilayers

Persson, P. O. A.; Skorupa, W.; Panknin, D.; Kuznetsov, A.; Hallen, A.; Hultman, L.

no abstract

  • Contribution to proceedings
    Materials Research Society Symposium Proceeding 640 (2001) H6.2.1

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