Paint layers - depth resolved analysis at the particle accelerator

Paint layers - depth resolved analysis at the particle accelerator

Neelmeijer, C.; Mäder, M.; Schramm, H.-P.

PIXE, proton induced X-ray emission, is a proven method for non-destructive substantial analysis of art objects. By varying the proton energy this technique succeeds also in the non-destructive identification of layer sequences. Very thin surface layers can be characterised by simultaneous RBS, the detection of backscattered protons.

Keywords: paint layers; layer sequences; non-destructive analysis; ion beam analysis; depth resolved analysis; PIXE; RBS

  • Book (Authorship)
    Ion beam study of art and archaeological objects, ed. by G. Demortier and M. Adriaens, European Commission, Brussels, ISBN 92-828-7652-7 (2000), pp. 15-20

Permalink: https://www.hzdr.de/publications/Publ-5733